Kelvin Probe System

The Kelvin Probe system is used to study the electrical surface state of samples and is specifically designed to measure the electronic

 work function of semiconductor sample surfaces.

The scanning Kelvin probe measures contact potential difference (CPD) values to evaluate the work function of semiconductor and 

conductive materials. This technique originated in the late 19th century and was first proposed by the British scientist Lord Kelvin. 

With continuous advancements in science and technology, the Kelvin probe technique has been gradually improved and refined, 

and its application fields have continued to expand. Currently, Kelvin probe technology has become an important research tool in 

fields such as surface science, materials science, and microelectronics.

Applicable Research Scope

· Work function of materials

· Position of the Fermi level

· n- or p-type semiconductors

· Bandgap of semiconductors

· Surface potential

· Surface state density

· Surface charging/discharging effects

· Minority carrier diffusion length

· Effects of temperature and humidity on work function

· More properties

Probe Structure Diagram

The probe is designed and manufactured by Instytut Fotonowy and offers significant advantages: it can obtain a strong signal even at a

 distance of 0.5 mm from the sample. This makes it reliably usable regardless of whether the sample surface is rough or polished.

 Additionally, the probe design is transparent, allowing a vertical light beam to illuminate the sample. Oscillation is driven by an

 electromagnet to ensure precise measurement.

Electrochemical Kelvin Probe System: The scanning Kelvin probe can measure the contact potential difference (CPD) at a single point and scan the entire sample surface to analyze surface conditions, evaluating electrical properties such as surface defects and surface state density.

We offer a range of high-performance Kelvin probe systems designed to meet different testing needs and application scenarios, 

ensuring efficient and accurate surface analysis and electrochemical measurements. Whether for basic surface work function studies or

 high-precision electrochemical sample analysis, our series of systems provides comprehensive solutions, helping researchers achieve

 breakthrough results in materials science, electronic performance testing, and electrochemistry. Each system has been meticulously

 designed to deliver advanced measurement accuracy and reliability for users.

Single-Point Kelvin Probe System: Used for work function studies, capable of precisely measuring the contact potential difference (CPD) at 

a specific location on the sample surface.

Single-Point Kelvin Probe System: Used for work function studies, capable of precisely measuring the contact potential difference (CPD)

 at a specific location on the sample surface.

Scanning Kelvin Probe System: Used for analyzing the surface condition of samples, capable of evaluating properties such as surface 

defects and surface state density.

Complete Kelvin Probe System:Fotonowy's Complete Kelvin Probe System has broken through the key bottleneck in contact potential 

difference measurements, enabling accurate differentiation between changes in the sample work function and the probe work function.

 It provides higher-precision measurements and is widely used in surface work function studies, electronic performance testing, and 

material analysis.