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Surface Integrity Kelvin Probe System
Introduce

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Update time: 2026-05-29
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"Complete Kelvin Probe System"

Breaking convention, eliminating ambiguity in contact potential difference measurements

The Complete Kelvin Probe System developed by Fotonowy has resolved a key bottleneck in Kelvin probe technology that has persisted

 for 150 years, particularly the difficulty in distinguishing between changes in sample work function and changes in probe work function 

during contact potential difference (CPD) measurements. This system not only inherits all the basic functions of a traditional Kelvin 

probe but also achieves precise measurement of the contact potential difference (CPD) of both the sample and the probe relative to 

ground.

Accurate, reliable, and versatile CPD measurement

This system provides a more accurate and reliable solution for contact potential difference measurements and establishes a new 

standard for potential difference measurements in scientific research. Whether in surface work function studies, electronic performance

 testing, or material surface state analysis, it delivers enhanced measurement precision, helping researchers gain deeper insights into 

electrochemical and material properties.

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"Example of the Complete Kelvin Probe Working Principle"

5.pngSample–probe contact potential difference (CPD): Sample–probe contact potential difference (blue) versus recorded ambient air temperature (green) and relative humidity (orange).

6.pngSample–ground contact potential difference: The sample–ground contact potential difference (red) is shown together with the recorded ambient air temperature (green) and relative humidity (orange). It represents only a small fraction of the sample–probe variation.

7.pngTip–ground contact potential difference: The tip–ground contact potential difference (gold) is shown against the recorded ambient air temperature (green) and relative humidity (orange). Most of the variation in the contact potential difference is caused by changes on the probe surface.

"Technical Specifications"

System Overview:

· Measurement technique: 2-channel lock-in amplifier

· Laser barrier: Automatically detects the substrate and prevents the probe tip from striking the sample

· Auxiliary sensors: Humidity, temperature

· Small light: Laser pointer used to indicate the measurement spot on the sample surface

Sample Fixtures:

· Free-form solid top-contact fixture, bottom-contact fixture, electrochemical fixture

Faraday Cage:

· Standard / Airtight with inert gas flow system

Measurement Unit:

· Bias voltage range: -5 to 5 V

· Voltage measurement resolution: 0.15 mV

· Current ranges: 300 nA, 30 nA, 3 nA, 300 pA

Probe Tip:

· Probe tip type: Gold mesh, 2.5 mm diameter

· Positioning resolution on the vertical axis: 20 μm

· Automatic resonance frequency scanning, adjustable vibration amplitude

· Automatic removal of parasitic current from the probe tip

· Typical CPD measurement distance: 0.2 – 1 mm

XY Control Stage:

· Motorized: Controlled via software

· Dimensions: 50 x 50 mm

· Travel range: 50 x 50 mm










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